Performance And Reliability Of Semiconductor Devices
Author: Michael Mastro, Jeffrey Laroche, Jun Bae, Jin-Woo Kim, Myung-Soo Kim
Binding: Hardback
Publisher: MRS MATERIALS RESEARCH SOCIETY, 2009
Condition remarks:
Book: Good
Jacket: N/A
Pages: Good
Markings: No markings
This academic text addresses the critical aspects of semiconductor device engineering. It details the intricate mechanisms governing the operational performance and long-term reliability of various semiconductor components. The work presents comprehensive analyses of failure modes and degradation processes, offering insights crucial for advanced device design. It further illustrates methodologies for enhancing durability and ensuring consistent functionality in cutting-edge electronic systems. This authoritative volume is an essential resource for researchers and professionals in materials science and electrical engineering.
Performance And Reliability Of Semiconductor Devices
Author: Michael Mastro, Jeffrey Laroche, Jun Bae, Jin-Woo Kim, Myung-Soo Kim
Binding: Hardback
Publisher: MRS MATERIALS RESEARCH SOCIETY, 2009
Condition remarks:
Book: Good
Jacket: N/A
Pages: Good
Markings: No markings
This academic text addresses the critical aspects of semiconductor device engineering. It details the intricate mechanisms governing the operational performance and long-term reliability of various semiconductor components. The work presents comprehensive analyses of failure modes and degradation processes, offering insights crucial for advanced device design. It further illustrates methodologies for enhancing durability and ensuring consistent functionality in cutting-edge electronic systems. This authoritative volume is an essential resource for researchers and professionals in materials science and electrical engineering.
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Author: Michael Mastro, Jeffrey Laroche, Jun Bae, Jin-Woo Kim, Myung-Soo Kim
Binding: Hardback
Publisher: MRS MATERIALS RESEARCH SOCIETY, 2009
Condition remarks:
Book: Good
Jacket: N/A
Pages: Good
Markings: No markings
This academic text addresses the critical aspects of semiconductor device engineering. It details the intricate mechanisms governing the operational performance and long-term reliability of various semiconductor components. The work presents comprehensive analyses of failure modes and degradation processes, offering insights crucial for advanced device design. It further illustrates methodologies for enhancing durability and ensuring consistent functionality in cutting-edge electronic systems. This authoritative volume is an essential resource for researchers and professionals in materials science and electrical engineering.
